Nagano, Japan

Yuji Ogawa

This inventor holds 3 USPTO granted patents. Top assignees: Dowa Mining Co., Ltd., Fuji Electric Co., Ltd., Fuji Electronic Co., Ltd.. Active years: 2004-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Ogawa. Retrieved from https://idiyas.com/inventor/yuji-ogawa-06ln1x0j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.4

ph-index = 3

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2004-2015

Loading Chart...
3 patents (USPTO):Explore Patents

Title: The Innovations of Yuji Ogawa

Introduction

Yuji Ogawa is a notable inventor based in Nagano, Japan. He has made significant contributions to the field of technology, particularly in the area of xerographic photoreceptors. With a total of three patents to his name, Ogawa's work has had a lasting impact on the industry.

Latest Patents

One of his latest patents is the "Flange for Xerographic Photoreceptor." This invention showcases his expertise and innovation in developing components that enhance the functionality of xerographic systems. His work in this area demonstrates a commitment to improving technology and efficiency.

Career Highlights

Throughout his career, Yuji Ogawa has worked with prominent companies such as Dowa Mining Co., Ltd. and Fuji Electric Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to various technological advancements.

Collaborations

Ogawa has collaborated with talented individuals in his field, including Keiichi Kurokawa and Yukihiro Kitamura. These partnerships have fostered innovation and have been instrumental in the development of his patents.

Conclusion

In summary, Yuji Ogawa is a distinguished inventor whose work in xerographic technology has led to valuable patents and collaborations. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…