Nagasaki, Japan

Yuji Kobayashi

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Electric Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Kobayashi. Retrieved from https://idiyas.com/inventor/yuji-kobayashi-9gd7d6jp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Yuji Kobayashi: Innovator in Semiconductor Technology

Introduction

Yuji Kobayashi is a notable inventor based in Nagasaki, Japan. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a unique semiconductor inspection jig.

Latest Patents

Kobayashi holds a patent for a semiconductor inspection jig. This jig includes a base on which a semiconductor device is placed. It features a substrate provided on the base, which includes a conductive pattern. The conductive pattern intersects with a lead of the semiconductor device from a direction other than horizontal. It is designed to contact an intermediate part of the lead without touching the leading end.

Career Highlights

Yuji Kobayashi is associated with Mitsubishi Electric Corporation, a leading company in the electronics industry. His work at Mitsubishi Electric has allowed him to focus on advancing semiconductor technologies. His contributions have been instrumental in enhancing the efficiency of semiconductor inspections.

Collaborations

Kobayashi has collaborated with talented coworkers, including Tetsuya Kitagawa and Tomohito Taniuchi. Their teamwork has fostered innovation and development in their projects.

Conclusion

Yuji Kobayashi is a prominent figure in semiconductor innovation, with a patent that showcases his expertise. His work continues to influence the industry and drive advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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