Hinode, Japan

Yuji Ikeda

This inventor holds 4 USPTO granted patents. Top assignee: Renesas Technology Corp.. Active years: 2004-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Ikeda. Retrieved from https://idiyas.com/inventor/yuji-ikeda-ecn4kn9u

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 25.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2004-2010

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4 patents (USPTO):Explore Patents

Title: Yuji Ikeda: Innovator in Electronic Tag Technology

Introduction

Yuji Ikeda is a prominent inventor based in Hinode, Japan. He has made significant contributions to the field of electronic tag technology, holding a total of 4 patents. His work focuses on creating innovative solutions that enhance the functionality and reliability of electronic tags.

Latest Patents

One of Ikeda's latest patents is an inlet for an electronic tag. This invention comprises an insulating film, antennas made of a conductor layer, and a slit formed in each antenna. The design includes a semiconductor chip that is electrically connected to the antennas via bump electrodes, along with a resin for sealing the semiconductor chip. This invention aims to actualize the formation of a thin and highly reliable inlet for non-contact type electronic tags.

Career Highlights

Ikeda is currently associated with Renesas Technology Corporation, where he continues to develop cutting-edge technologies. His expertise in electronic tags has positioned him as a key player in the industry, contributing to advancements that improve the efficiency and effectiveness of these devices.

Collaborations

Ikeda has worked alongside notable colleagues such as Takeshi Saito and Michio Okamoto. Their collaborative efforts have further propelled innovations in the field of electronic tags.

Conclusion

Yuji Ikeda's contributions to electronic tag technology exemplify his commitment to innovation and excellence. His patents reflect a deep understanding of the technical challenges in this area, and his work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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