Kumamoto, Japan

Yuji Furukawa

This inventor holds 1 USPTO granted patent. Top assignee: Sony Semiconductor Solutions Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Furukawa. Retrieved from https://idiyas.com/inventor/yuji-furukawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Yuji Furukawa: Innovator in Image Pickup Element Inspection

Introduction

Yuji Furukawa is a notable inventor based in Kumamoto, Japan. He has made significant contributions to the field of image processing technology. His work primarily focuses on the inspection of image pickup elements, which are crucial in various imaging applications.

Latest Patents

Furukawa holds a patent for an "Inspection apparatus and inspection method." This invention relates to a system that enables the inspection of the performance of an image pickup element. The apparatus generates collimated light and transmits part of it through a transmission filter with circular holes arranged regularly. This process converts the light into rays of columnar collimated light, which are then captured by the image pickup element being inspected. The method involves comparing the captured image with an ideal image to assess the performance of the element. He has 1 patent to his name.

Career Highlights

Yuji Furukawa is currently employed at Sony Semiconductor Solutions Corporation. His role involves developing innovative technologies that enhance imaging systems. His expertise in this area has positioned him as a valuable asset to his company.

Collaborations

Furukawa has worked alongside talented colleagues, including Katsuji Kimura and Hiroyuki Yamanaka. Their collaborative efforts contribute to advancing technology in the semiconductor field.

Conclusion

Yuji Furukawa's contributions to the inspection of image pickup elements highlight his innovative spirit and dedication to technology. His work continues to influence advancements in imaging systems, showcasing the importance of his inventions in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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