Hachioji, Japan

Yuji Fujisawa

This inventor holds 1 USPTO granted patent. Top assignee: Jasco Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Fujisawa. Retrieved from https://idiyas.com/inventor/yuji-fujisawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Yuji Fujisawa: Innovator in Optical Measurement Technology

Introduction

Yuji Fujisawa is a notable inventor based in Hachioji, Japan. He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique method for measuring optical rotating power.

Latest Patents

Fujisawa holds a patent for an "Optical rotating power measurement method and optical rotating power measurement apparatus." This invention involves a method that starts measuring the optical rotating power of a sample during a temperature-changing process. The method includes obtaining temperature data and optical rotating power data over time, establishing a straight-line relationship between these data points. This relationship is crucial for determining the optical rotating power data at a predetermined temperature.

Career Highlights

Yuji Fujisawa is associated with Jasco Corporation, where he applies his expertise in optical measurement technologies. His work has been instrumental in advancing the capabilities of measurement apparatuses used in various scientific applications.

Collaborations

Fujisawa has collaborated with notable colleagues, including Mutsumi Senuma and Atsushi Yamada. Their combined efforts contribute to the innovative environment at Jasco Corporation.

Conclusion

Yuji Fujisawa's contributions to optical measurement technology exemplify the impact of innovation in scientific research. His patent reflects a significant advancement in the field, showcasing his dedication to improving measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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