The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Feb. 20, 2008
Hisashi Masago, Hachioji, JP;
Tomoyuki Fukazawa, Hachioji, JP;
Mutsumi Senuma, Hachioji, JP;
Atsushi Yamada, Hachioji, JP;
Yuji Fujisawa, Hachioji, JP;
Hisashi Masago, Hachioji, JP;
Tomoyuki Fukazawa, Hachioji, JP;
Mutsumi Senuma, Hachioji, JP;
Atsushi Yamada, Hachioji, JP;
Yuji Fujisawa, Hachioji, JP;
JASCO Corporation, Hachioji-shi, Tokyo, JP;
Abstract
An optical rotating power measurement method comprising: an optical rotating power data acquisition step of starting measurement of the optical rotating power of the sample in a measurement apparatus during a temperature changing process where a controller controls the temperature of the sample such that the temperature reaches the predetermined temperature and of obtaining temperature data and optical rotating power data of the sample as time passes during the temperature changing process; and a data processing step of obtaining a straight line relationship data between the temperature data and the optical rotating power data, by using the fact that the optical rotating power of the sample is proportional to a measurement temperature; wherein the optical rotating power data of the sample at the predetermined temperature or the temperature dependence data of the optical rotating power of the sample is determined based on the straight line relationship data.