Tokyo, Japan

Yuji Asakura

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Asakura. Retrieved from https://idiyas.com/inventor/yuji-asakura-39zn5s7c

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yuji Asakura: Innovator in Electron Microscopy

Introduction

Yuji Asakura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electron microscopy, particularly through his innovative designs and patents. His work focuses on enhancing the performance of sample holders used in electron microscopes.

Latest Patents

Asakura holds a patent for a "Sample holder and electron microscope." This invention improves the performance of a sample holder that can be filled with a liquid sample. The design includes an upper tip positioned on the irradiation side of an electron beam and a lower tip facing the upper tip. The sample holder features diaphragms in both the upper and lower tips, a space that can be filled with liquid, and a guide portion that directs excess liquid to drop from the side opposite the electron beam.

Career Highlights

Yuji Asakura is associated with Hitachi High-Tech Corporation, where he continues to develop innovative solutions in electron microscopy. His work has been instrumental in advancing the capabilities of electron microscopes, making them more efficient and effective for various applications.

Collaborations

Asakura collaborates with Michio Hatano, a fellow innovator in the field. Their partnership has led to advancements in technology and research within the realm of electron microscopy.

Conclusion

Yuji Asakura's contributions to the field of electron microscopy through his innovative patents and collaborations highlight his role as a key inventor. His work continues to influence the development of advanced microscopy techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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