Sunnyvale, CA, United States of America

Yuichi Miyazawa

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Toshiba. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuichi Miyazawa. Retrieved from https://idiyas.com/inventor/yuichi-miyazawa-81bsdx23

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Yuichi Miyazawa: Innovator in Delay Time Measurement Technology

Introduction

Yuichi Miyazawa is a notable inventor based in Sunnyvale, California. He has made significant contributions to the field of electronics, particularly in the area of delay time measurement circuits. His innovative work has implications for evaluating the operation speed of high-speed circuits.

Latest Patents

Miyazawa holds a patent for a Delay Time Measuring Circuit. This circuit includes a delay circuit that alters the delay times of first and second clock signals. It measures the delay time of an evaluated circuit based on an externally supplied control voltage. Additionally, it features a voltage-controlled oscillator whose oscillation frequency is also controlled by the same voltage. This design allows for precise evaluation of the operation speed of high-speed circuits.

Career Highlights

Yuichi Miyazawa is associated with Kabushiki Kaisha Toshiba, a leading company in the technology sector. His work at Toshiba has allowed him to focus on developing advanced electronic solutions that enhance circuit performance.

Collaborations

Miyazawa has collaborated with Kiyoji Ueno, contributing to the advancement of technology in their field. Their partnership has fostered innovation and development in delay time measurement techniques.

Conclusion

Yuichi Miyazawa's contributions to delay time measurement technology exemplify his commitment to innovation in electronics. His work continues to influence the evaluation of high-speed circuits, showcasing the importance of precise measurement in modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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