The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 1995
Filed:
Sep. 30, 1993
Applicant:
Inventors:
Kiyoji Ueno, Kawasaki, JP;
Yuichi Miyazawa, Sunnyvale, CA (US);
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
324617 ; 327250 ; 327252 ; 368120 ;
Abstract
A delay time measuring circuit includes a delay circuit for changing the delay times of first and second clock signals output to measure the delay time of an evaluated circuit according to an externally supplied control voltage, and a voltage controlled oscillator whose oscillation frequency is controlled by the same control voltage as that used for the delay circuit, and is constructed to measure the delay time of the evaluated circuit based on an output of the voltage controlled oscillator. Therefore, it is possible to precisely evaluate the operation speed of a circuit operating at high speed.