Tokyo, Japan

Yuichi Madokoro

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Science Corporation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuichi Madokoro. Retrieved from https://idiyas.com/inventor/yuichi-madokoro-l2tkypqa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Yuichi Madokoro: Particle Beam Apparatus Innovation

Introduction

Yuichi Madokoro is an inventor associated with Hitachi High-Tech Science Corporation in Tokyo, Japan. His work includes an invention designed to enable selective switching between charged-particle and neutral-particle beams.

Latest Patents

Madokoro is credited with 1 patent: “Particle Beam Apparatus and Composite Beam Apparatus.” The invention describes a particle beam column containing an ion source, a condenser lens, a charge exchange grid, and an objective lens. The ion source generates ions, while the condenser lens adjusts the ion beam’s focus to switch between ion-beam and neutral-beam irradiation. The charge exchange grid neutralizes at least part of the ion beam, and the downstream objective lens reduces the ion beam toward the sample when neutral-particle-beam irradiation is used.

Career Highlights

Madokoro’s patent reflects work on particle-beam equipment and the control of beam types used to irradiate samples. The disclosed apparatus is intended to support appropriate, selective switching between charged and neutral particle beams.

Collaborations

Madokoro is associated with Hitachi High-Tech Science Corporation. Koji Nagahara is identified as a coworker.

Conclusion

Yuichi Madokoro’s patent describes a particle-beam apparatus that combines beam focusing and charge exchange to facilitate switching between ion and neutral particle irradiation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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