Utsunomiya, Japan

Yuichi Kikuchi

This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuichi Kikuchi. Retrieved from https://idiyas.com/inventor/yuichi-kikuchi-tahzaers

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Yuichi Kikuchi: Innovator in Precision Measurement

Introduction

Yuichi Kikuchi is a notable inventor based in Utsunomiya, Japan. He has made significant contributions to the field of precision measurement, particularly through his innovative designs and patents. His work is recognized for enhancing accuracy and efficiency in measurement tools.

Latest Patents

Yuichi Kikuchi holds a patent for a height gauge, which is a crucial instrument used in various industries for precise height measurements. This invention showcases his commitment to advancing measurement technology and improving user experience.

Career Highlights

Kikuchi is associated with Mitutoyo Corporation, a leading company in the manufacturing of precision measuring instruments. His role at Mitutoyo has allowed him to contribute to the development of high-quality measurement tools that are widely used across different sectors.

Collaborations

Throughout his career, Yuichi Kikuchi has collaborated with talented individuals such as Kenji Iwamoto and Masanori Seki. These collaborations have fostered innovation and have led to the successful development of various measurement solutions.

Conclusion

Yuichi Kikuchi's contributions to the field of precision measurement through his patent for a height gauge and his work at Mitutoyo Corporation highlight his importance as an inventor. His dedication to innovation continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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