This inventor holds 1 USPTO granted patent. Top assignees: Beijing Eswin Computing Technology Co., Ltd., Guangzhou Transa Semi Information Technology Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Yufeng Peng: Innovator in GRPC-based Chip Testing
Introduction
Yufeng Peng is a notable inventor based in Beijing, China. He has made significant contributions to the field of chip testing, particularly through his innovative methods and apparatuses. His work focuses on enhancing the efficiency and effectiveness of chip testing processes.
Latest Patents
Yufeng Peng holds a patent for a GRPC-based chip test method, a GRPC-based chip test apparatus, and a storage medium. The embodiments of this application provide a comprehensive approach to chip testing. The GRPC-based chip test method involves determining the number of chips that need testing, issuing remote instrument call requests, acquiring these requests based on the GRPC protocol, and sorting them to create a request execution sequence table. This method allows for the sequential testing of chips, optimizing the testing process.
Career Highlights
Throughout his career, Yufeng Peng has worked with several prominent companies. He has been associated with Beijing Eswin Computing Technology Co., Ltd. and Guangzhou Transa Semi Information Technology Co., Ltd. His experience in these organizations has contributed to his expertise in chip testing technologies.
Collaborations
Yufeng Peng has collaborated with notable colleagues, including Huichuang Ma and Zeliang Xie. These collaborations have likely enriched his work and led to advancements in the field of chip testing.
Conclusion
Yufeng Peng is a distinguished inventor whose contributions to GRPC-based chip testing have made a significant impact in the technology sector. His innovative methods and collaborative efforts continue to shape the future of chip testing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile