Monmouth Junction, NJ, United States of America

Yufei Li

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yufei Li. Retrieved from https://idiyas.com/inventor/yufei-li-wclmk00y

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yufei Li: Innovator in Log Anomaly Detection

Introduction

Yufei Li is a prominent inventor based in Monmouth Junction, NJ (US). He has made significant contributions to the field of computer science, particularly in the area of log anomaly detection. His innovative approach utilizes advanced graph-based techniques to enhance the reliability of system logs.

Latest Patents

Yufei Li holds a patent titled "Log anomaly detection using temporal-attentive dynamic graphs." This patent describes a computer-implemented method for employing a graph-based log anomaly detection framework to identify relational anomalies in system logs. The method involves collecting log events from various systems, constructing dynamic graphs to illustrate relationships among these events, and utilizing temporal-attentive transformers to capture sequential patterns and detect anomalies effectively.

Career Highlights

Yufei Li is currently associated with NEC Corporation, where he applies his expertise in developing innovative solutions for log analysis. His work has been instrumental in improving the accuracy and efficiency of log anomaly detection processes.

Collaborations

Some of Yufei Li's notable coworkers include Yanchi Liu and Haifeng Chen, who contribute to the collaborative efforts in advancing technology within their field.

Conclusion

Yufei Li's contributions to log anomaly detection exemplify the impact of innovative thinking in technology. His patent and work at NEC Corporation highlight his commitment to enhancing system reliability through advanced methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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