Shanghai, China

Yufang Li


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021-2023

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2 patents (USPTO):Explore Patents

Title: Innovations of Yufang Li in Test and Measurement Instruments

Introduction

Yufang Li is a notable inventor based in Shanghai, China, recognized for his contributions to the field of test and measurement instruments. With a total of two patents to his name, he has made significant advancements in monitoring waveforms and enhancing the functionality of devices under test.

Latest Patents

Yufang Li's latest patents include innovative technologies that improve the accuracy and efficiency of waveform monitoring. One of his patents focuses on a test and measurement instrument that includes a signal generator configured to generate a waveform sent over a cable to a device under test (DUT). This invention features a real-time waveform monitor (RTWM) circuit that determines the propagation delay of the cable, captures incident and reflection waveforms at various test points, and ultimately determines the DUT waveform. His second patent involves a test and measurement instrument that monitors the waveform received at a DUT. This device utilizes a signal generator circuit and a waveform monitor circuit to capture signals at multiple test points, allowing for the determination of both incident and reflected waveforms.

Career Highlights

Yufang Li is currently employed at Tektronix, Inc., where he continues to develop cutting-edge technologies in the field of test and measurement. His work has significantly contributed to the advancement of measurement techniques and the reliability of test instruments.

Collaborations

Yufang Li collaborates with talented individuals such as Sicong Zhu and Jianjie Huang, who contribute to the innovative environment at Tektronix, Inc. Their teamwork fosters creativity and leads to the development of groundbreaking technologies.

Conclusion

Yufang Li's contributions to the field of test and measurement instruments exemplify the impact of innovation on technology. His patents reflect a commitment to enhancing the accuracy and efficiency of waveform monitoring, making significant strides in the industry.

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