This inventor holds 1 USPTO granted patent. Top assignee: Amlogic (Shanghai) Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Yueting Li: Innovator in Duty Cycle Calibration Technology
Introduction
Yueting Li is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of electronic devices, particularly in the area of duty cycle calibration. His innovative approach has led to advancements that enhance the accuracy of electronic measurements.
Latest Patents
Yueting Li holds a patent for a "Duty cycle calibration circuit and method, chip, and electronic device." This invention provides a duty cycle calibration circuit and method that utilizes a counting clock signal with a higher frequency than the calibration clock signal. The counting unit in this circuit acquires the number of counting pulses generated during the high-level and low-level states of the calibration clock signal within a preset counting period. This method improves the accuracy of measuring the duty cycle, overcoming inaccuracies that can arise when using a reference clock signal.
Career Highlights
Yueting Li is currently employed at Amlogic (Shanghai) Co., Ltd., where he continues to develop innovative technologies. His work focuses on enhancing electronic devices through improved calibration methods. His contributions have been instrumental in advancing the capabilities of modern electronics.
Collaborations
Yueting Li collaborates with talented individuals such as Jianyu Ding and Hong Li, who contribute to the innovative environment at Amlogic. Their teamwork fosters creativity and drives the development of cutting-edge technologies.
Conclusion
Yueting Li's work in duty cycle calibration technology exemplifies the impact of innovation in the electronics industry. His patent and ongoing contributions highlight the importance of precision in electronic measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile