The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Aug. 30, 2022
Applicant:

Amlogic (Shanghai) Co., Ltd, Shanghai, CN;

Inventors:

Jianyu Ding, Shanghai, CN;

Yueting Li, Shanghai, CN;

Yang Yang, Shanghai, CN;

Xu Guo, Shanghai, CN;

Yang Liu, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/017 (2006.01); H03K 5/156 (2006.01);
U.S. Cl.
CPC ...
H03K 3/017 (2013.01); H03K 5/156 (2013.01);
Abstract

Provided are a duty cycle calibration circuit and method, a chip, and an electronic device. In the duty cycle calibration circuit, through a counting clock signal having a higher clock signal frequency than a calibration clock signal, a counting unit is configured to acquire a number of counting pulses generated in a high-level state and a low-level state of the calibration clock signal within a preset counting period, so as to obtain an actual duty cycle of the calibration clock signal. Compared with a method of acquiring a duty cycle of a calibration clock signal by comparing the calibration clock signal with a reference clock signal, inaccurate measurement of the duty cycle of the calibration clock signal after the reference clock signal is affected can be overcome. Therefore, accuracy of measurement of the duty cycle can be improved, and precision of calibration of the duty cycle can be improved accordingly.


Find Patent Forward Citations

Loading…