Company Filing History:
Years Active: 2003-2011
Title: Yuen Lim: Innovator in Thin Film Adhesion Testing
Introduction
Yuen Lim is a notable inventor based in San Jose, CA. He has made significant contributions to the field of adhesion testing for thin film materials. With a total of 5 patents to his name, Lim's work has advanced the understanding and application of adhesion characteristics in various processing environments.
Latest Patents
Among his latest patents is the Junction Photovoltage Probe Face, which focuses on the method and apparatus for adhesion testing of thin film materials. This innovative apparatus is designed for the automatic testing of the adhesion characteristics of thin films and coatings to silicon wafers. It processes the data obtained to provide users with a rapid and accurate forecast of the thin film's behavior in selected processing environments. The apparatus is capable of heating and cooling samples while automatically monitoring for debonding. Information collected from optical and thermal devices is processed by a computer for analysis and recorded for cataloging. Over time, data is collected while samples are subjected to selected temperature environments, creating a comprehensive database of adhesion characteristics for thin films and coatings.
Career Highlights
Throughout his career, Yuen Lim has worked with various companies, including Ahbee 1, L.P. His innovative approaches and dedication to research have positioned him as a key figure in his field.
Collaborations
Lim has collaborated with notable coworkers such as Phuc Van and Michael Current, contributing to the advancement of technology in adhesion testing.
Conclusion
Yuen Lim's contributions to the field of thin film adhesion testing are significant and impactful. His innovative patents and collaborative efforts continue to shape the industry and enhance the understanding of material behaviors.