Yueh-Nan Chen

Title: Innovations by Yueh-Nan Chen

Introduction

Yueh-Nan Chen is a notable inventor based in Taichung, Taiwan. He has made significant contributions to the field of technology, particularly in the area of defect detection in panels. His innovative approach has led to the development of a unique patent that enhances the accuracy of defect location reporting.

Latest Patents

Yueh-Nan Chen holds a patent for a "Panel design to improve accurate defect location report." This invention describes an array checker (AC) that includes software designed to implement a specific method. By utilizing this method, the array checker can detect the location of a defect and compensate for any shifts in that defect. The process involves generating reference lines in a panel, which are known prior to capturing an image of the panel. The array checker captures this image using voltage imaging, which includes both the defect and the reference lines. The method further calculates the offset of the reference line from its known location and applies this offset to the defect location to compensate for any shifts.

Career Highlights

Yueh-Nan Chen is currently employed at Orbotech Limited, a company known for its advanced technology solutions. His work at Orbotech has allowed him to focus on innovations that improve manufacturing processes and quality control.

Collaborations

Some of his notable coworkers include Nai-Wei Chen and Chih-Chang Lai, who contribute to the collaborative environment that fosters innovation at Orbotech Limited.

Conclusion

Yueh-Nan Chen's contributions to the field of technology through his patent demonstrate his commitment to improving defect detection methods. His work not only enhances the accuracy of reporting but also showcases the importance of innovation in manufacturing processes.