Yueh-Long Lee

Title: Innovations by Yueh-Long Lee

Introduction

Yueh-Long Lee is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of measurement technology, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of profile measurement methods.

Latest Patents

Yueh-Long Lee holds a patent for a "Profile measuring method, profile measuring apparatus, and deformation detecting apparatus." This method involves several steps to measure the profile of an object-under-test. It utilizes a light source, a light-transmissive projection film, and an image capturing device. The light-transmissive projection film is strategically placed between the light source and the image capturing device. The object-under-test is positioned between these components, allowing a light beam to create a projection on the film. The image capturing device then captures this projection, enabling the calculation of the measuring size of the object-under-test based on the projection size. This innovative approach enhances the precision of profile measurements and deformation detection.

Career Highlights

Yueh-Long Lee is associated with Utechzone Co., Ltd., where he continues to develop and refine his inventions. His work at Utechzone has positioned him as a key player in the field of measurement technology.

Collaborations

Yueh-Long Lee collaborates with Po-Tsung Lin, who is also a valuable contributor to their projects. Together, they work on advancing measurement technologies and exploring new applications for their inventions.

Conclusion

Yueh-Long Lee's innovative contributions to profile measurement technology demonstrate his commitment to enhancing precision in this field. His patent reflects a significant advancement that can benefit various industries.