The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
May. 03, 2017
Utechzone Co., Ltd., New Taipei, TW;
Yueh-Long Lee, New Taipei, TW;
Po-Tsung Lin, New Taipei, TW;
UTECHZONE CO., LTD., New Taipei, TW;
Abstract
A profile measuring method used to measure a profile of an object-under-test includes the following steps. A light source, a light-transmissive projection film, and an image capturing device are provided, where the light-transmissive projection film is located between the light source and the image capturing device. The object-under-test is placed between the light source and the light-transmissive projection film, and a light beam is provided toward the light-transmissive projection film by the light source, to form an object-under-test projection of the object-under-test on the light-transmissive projection film. An image of the object-under-test projection is captured by the image capturing device, to obtain a projection size of the object-under-test projection. A measuring size of the object-under-test is calculated according to the projection size of the object-under-test projection. In addition, a profile measuring apparatus and a deformation detecting apparatus are also provided.