Ann Arbor, MI, United States of America

Yucong Lin

This inventor holds 3 USPTO granted patents. Top assignee: Woven by Toyota, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yucong Lin. Retrieved from https://idiyas.com/inventor/yucong-lin-bq3r74jx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 33.3

Average Co-Inventor Count = 2.4

ph-index = 1


Company Filing History:


Years Active: 2026

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3 patents (USPTO):Explore Patents

Title: Innovations by Yucong Lin in Surface Bias Estimation

Introduction

Yucong Lin is an accomplished inventor based in Ann Arbor, MI (US). He has made significant contributions to the field of surface bias estimation, showcasing his expertise through his innovative patent.

Latest Patents

Yucong Lin holds a patent titled "Systems and methods for cross slope bias estimation." This patent describes systems, methods, and other embodiments that relate to implementing surface bias estimation strategies. In one embodiment, the method includes processing probe trace data with a factor graph that has nodes and factors describing an estimate of surface bias. Additionally, it involves correcting the probe trace data based on the estimate of surface bias. He has 1 patent to his name.

Career Highlights

Yucong Lin is currently employed at Woven by Toyota, Inc., where he continues to develop innovative solutions in his field. His work is characterized by a commitment to advancing technology and improving methodologies related to surface bias estimation.

Collaborations

One of his notable coworkers is Paul J Ozog, with whom he collaborates on various projects within the company.

Conclusion

Yucong Lin's contributions to the field of surface bias estimation highlight his innovative spirit and dedication to advancing technology. His work at Woven by Toyota, Inc. continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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