This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2023.
Company Filing History:
Years Active: 2023
Title: Yubin Du: Innovator in Real-Time Defect Measurement
Introduction
Yubin Du is a prominent inventor based in Zhejiang, China. He has made significant contributions to the field of defect measurement through his innovative approaches. His work focuses on enhancing the accuracy of real-time measurements in various applications.
Latest Patents
Yubin Du holds a patent for a "Real-time traceability method of width of defect based on divide-and-conquer." This invention utilizes a calibration transfer function and multidimensional eigenvector analysis technology. It addresses the challenges of accurately measuring the width of defects that are close to the diffraction limit of the system. The method employs an extreme random tree regression model trained by multidimensional eigenvector analysis technology, which is based on the electromagnetic field simulation database of defect scattered dark-field imaging.
Career Highlights
Yubin Du is affiliated with Zhejiang University, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in defect detection and measurement.
Collaborations
Yubin Du collaborates with notable colleagues, including Yongying Yang and Weimin Lou. Their combined expertise contributes to the advancement of innovative solutions in their field.
Conclusion
Yubin Du's contributions to real-time defect measurement exemplify the impact of innovative thinking in technology. His patent reflects a significant advancement in the ability to measure defects accurately, paving the way for future developments in the field.