Shanghai, China

Yuansheng Dai

This inventor holds 1 USPTO granted patent. Top assignee: Analog Devices International Unlimited Company. Active years: 2025.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yuansheng Dai: Innovator in Scanning LIDAR Systems

Introduction

Yuansheng Dai is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of scanning LIDAR systems, showcasing his expertise through innovative patents. His work focuses on enhancing the accuracy and efficiency of LIDAR technology.

Latest Patents

Yuansheng Dai holds a patent titled "Angle of rotation determination in scanning LIDAR systems." This patent discloses systems and methods for determining the angle of light transmitted by an illumination source in a scanning LIDAR system. The LIDAR system includes a pattern in the optical path of the transmitted light, which reflects a portion of the light to be detected by optical sensors. The controller associated with the LIDAR system determines the angle of the transmitted light based on the detected light, improving the system's overall functionality. He has 1 patent to his name.

Career Highlights

Yuansheng Dai is currently employed at Analog Devices International Unlimited Company, where he continues to develop innovative solutions in the field of LIDAR technology. His work has positioned him as a key player in advancing the capabilities of scanning systems.

Collaborations

Throughout his career, Yuansheng has collaborated with talented individuals such as Tairan Sun and Tao Yu. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Yuansheng Dai's contributions to scanning LIDAR systems exemplify his commitment to innovation and technological advancement. His patent work and collaborations highlight his role as a significant inventor in the field.

Profile summary based on public USPTO records.
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