The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Oct. 15, 2020
Applicant:

Analog Devices International Unlimited Company, Limerick, IE;

Inventors:

Yuansheng Dai, Shanghai, CN;

Tairan Sun, Shanghai, CN;

Tao Yu, Cambridge, MA (US);

Libo Meng, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/02 (2020.01); G01S 7/48 (2006.01); G01S 7/484 (2006.01); G01S 7/4861 (2020.01);
U.S. Cl.
CPC ...
G01S 17/02 (2013.01); G01S 7/4808 (2013.01); G01S 7/484 (2013.01); G01S 7/4861 (2013.01);
Abstract

Systems and methods for determining an angle of the light transmitted by an illumination source of a scanning LIDAR system are disclosed. An example LIDAR system includes a pattern, provided in an optical path of the light transmitted by the illumination source as the light is transmitted out of the system, and configured to reflect at least a portion of the transmitted light to be incident on at least one of one or more optical sensors of the LIDAR system. The LIDAR system further includes, or is associated with, a controller, configured to determine an angle of the transmitted light based on a light detected by at least one of the optical sensors, where at least a portion of the light detected by the optical sensor(s) includes at least a portion of the light transmitted by the illumination source and reflected by the pattern.


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