Suzhou, China

Yuanjun Shi

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignees: Solaris Nanofab Ltd., Twinsolution Technology (Suzhou) Ltd, Other. Active years: 2021-2026.

USPTO Granted Patents = 3 

% Patents Active = 66.7

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 1(Granted Patents)


Location History:

  • Suzhou, CN (2021)
  • Jiangsu, CN (2021)

Company Filing History:


Years Active: 2021-2026

Loading Chart...
3 patents (USPTO):Explore Patents

Title: Innovations of Yuanjun Shi

Introduction

Yuanjun Shi is a notable inventor based in Suzhou, China. He has made significant contributions to the field of semiconductor technology, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of semiconductor chip testing.

Latest Patents

Yuanjun Shi's latest patents include a coaxial socket of impedance matching structure for semiconductor chip testing and a vertical probe card. The coaxial socket invention relates to a testing method that includes a test socket locating substrate, a test socket body, a test socket cover, and a test probe. This design incorporates polymers to ensure optimal signal transmission and heat conduction. The vertical probe card features a printed circuit board with a receiving space for a probe that contacts a chip, enhancing the testing process.

Career Highlights

Throughout his career, Yuanjun Shi has worked with various companies, including Twinsolution Technology (Suzhou) Ltd. His innovative designs and patents have contributed to advancements in semiconductor testing technologies.

Collaborations

Yuanjun has collaborated with notable coworkers, including Kai Liu and Lanyong Yin, who have played a role in his professional journey.

Conclusion

Yuanjun Shi's contributions to semiconductor technology through his patents and collaborations highlight his importance as an inventor in the field. His work continues to influence advancements in semiconductor testing methodologies.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…