The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

May. 17, 2024
Applicant:

Solaris Nanofab Ltd., Suzhou, CN;

Inventors:

Yuanjun Shi, Suzhou, CN;

Lanyong Yin, Suzhou, CN;

Kai Liu, Suzhou, CN;

Yingdong Ji, Suzhou, CN;

Assignee:

SOLARIS NANOFAB LTD., Suzhou, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0466 (2013.01); G01R 31/2886 (2013.01);
Abstract

A test socket for 224 Gbps ultra-high-speed coaxial testing includes a test socket body made of metal and a test socket cover plate. The test socket body is provided with mounting holes, within which are set first polymer positioning parts that match the holes. The first polymer positioning part is provided with first and second insertion holes, into which test probes are respectively inserted. The test socket cover plate is fixedly provided with a second polymer positioning part, which has a first positioning hole that matches the first polymer positioning part, and a second positioning hole that is connected to the first positioning hole and matches the end of the test probe. The height of the first polymer positioning part is less than the length of the test probe, achieving a large dynamic bandwidth and high isolation for the coaxial test socket for ultra-high-speed testing frequencies.


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