Stanford, CA, United States of America

Yuan Yao

This inventor holds 1 USPTO granted patent. Top assignee: Leland Stanford Junior University. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuan Yao. Retrieved from https://idiyas.com/inventor/yuan-yao-deggp30c

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations in X-ray Imaging by Yuan Yao

Introduction

Yuan Yao is a notable inventor based in Stanford, California. He has made significant contributions to the field of x-ray imaging technology. His innovative approach has led to the development of a unique x-ray system that enhances imaging capabilities.

Latest Patents

Yuan Yao holds a patent for an "X-ray system utilizing alternating spectrum x-ray source in conjunction with a fixed spectrum separation filter." This apparatus is designed for x-ray imaging of an object. The system includes an x-ray source that provides alternating x-ray spectrums, a spectrum separation fixed filter, and an x-ray detector positioned opposite the x-ray source. This configuration allows for improved imaging quality and control.

Career Highlights

Yuan Yao is affiliated with Leland Stanford Junior University, where he continues to advance research in x-ray technology. His work has garnered attention for its potential applications in various fields, including medical imaging and material analysis.

Collaborations

Yuan Yao collaborates with esteemed colleagues, including Norbert Joseph Pelc, to further enhance the development of innovative imaging technologies.

Conclusion

Yuan Yao's contributions to x-ray imaging technology exemplify the impact of innovative thinking in the field. His patent and ongoing research at Leland Stanford Junior University highlight the importance of advancements in medical and scientific imaging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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