The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
Jun. 07, 2012
Applicants:
Yuan Yao, Stanford, CA (US);
Norbert J. Pelc, Los Altos, CA (US);
Inventors:
Yuan Yao, Stanford, CA (US);
Norbert J. Pelc, Los Altos, CA (US);
Assignee:
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/087 (2006.01); A61B 6/00 (2006.01); G01T 1/29 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01); A61B 6/4042 (2013.01); G01N 23/046 (2013.01); G01N 23/087 (2013.01); G01N 2223/419 (2013.01);
Abstract
An apparatus for x-ray imaging of an object is provided. An x-ray source for providing alternating x-ray spectrums is placed on a first side of the object. A spectrum separation fixed filter is placed between the x-ray source and the object. An x-ray detector is placed on a second side of the object opposite the x-ray source. A controller controls the x-ray source and the x-ray detector.