Company Filing History:
Years Active: 2011
Title: Innovations of Yuan-Li Ding
Introduction
Yuan-Li Ding is a notable inventor based in Singapore, SG. He has made significant contributions to the field of technology, particularly in the area of test pattern structures. His innovative work has led to the development of a patent that enhances the efficiency of detecting interconnection failures.
Latest Patents
Yuan-Li Ding holds a patent for a test pattern structure. This structure includes a first conductive layer and a second conductive layer. The second conductive layer is directly disposed on the first conductive layer and is connected to it through a plurality of connection interfaces. The test pattern structure he developed can detect interconnection failures quickly and accurately without the need for SEM identification. This innovation represents a significant advancement in the field.
Career Highlights
Yuan-Li Ding is currently employed at United Microelectronics Corporation, a leading company in the semiconductor industry. His work at this organization has allowed him to collaborate with other talented professionals and contribute to groundbreaking projects.
Collaborations
Some of his notable coworkers include Da-Jiang Yang and Chih-Ping Lee. Their collaborative efforts have further enhanced the innovative environment at United Microelectronics Corporation.
Conclusion
Yuan-Li Ding's contributions to the field of technology through his patent and work at United Microelectronics Corporation highlight his role as a significant inventor. His innovations continue to impact the industry positively.