Company Filing History:
Years Active: 2021-2024
Title: Innovations of Yu-Wen Chou in Wafer Testing Technology
Introduction
Yu-Wen Chou is a notable inventor based in Chu-Pei, Taiwan. He has made significant contributions to the field of wafer testing technology, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of probe cards and testing assemblies.
Latest Patents
One of his latest patents is titled "Probe card and wafer testing assembly thereof." This invention provides a comprehensive wafer testing assembly that includes a printed circuit board, a space transformer, copper pillars, and strengthening structure units. The printed circuit board features a bottom surface with first contacts, while the space transformer has a top surface with second contacts that correspond to the first contacts. The copper pillars connect these contacts, ensuring efficient electrical connections.
Another significant patent is the "Trace embedded probe device." This device comprises a circuit board with an insulating layer unit that features recesses for grounding and signal traces. The design allows for precise control over the distance, width, thickness, and surface roughness of the traces, making it advantageous for high-frequency testing and fine pitch requirements.
Career Highlights
Yu-Wen Chou is currently employed at Mpi Corporation, where he continues to innovate in the field of semiconductor testing. His work has been instrumental in advancing technologies that are critical for modern electronics.
Collaborations
He collaborates with talented coworkers, including Huo-Kang Hsu and Hui-Pin Yang, who contribute to the innovative environment at Mpi Corporation.
Conclusion
Yu-Wen Chou's contributions to wafer testing technology through his patents demonstrate his commitment to innovation in the semiconductor industry. His work not only enhances testing efficiency but also paves the way for future advancements in electronic testing solutions.