Taichung, Taiwan

Yu-Ting Wang

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu-Ting Wang. Retrieved from https://idiyas.com/inventor/yu-ting-wang-7b9i092k

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations of Yu-Ting Wang

Introduction

Yu-Ting Wang is a notable inventor based in Taichung, Taiwan. He has made significant contributions to the field of semiconductor technology. His work focuses on improving inspection and cleaning systems for wafers, which are crucial in the manufacturing process of semiconductors.

Latest Patents

Yu-Ting Wang holds a patent for an "Inspection and cleaning system and method for the same." This innovative system includes an inspection device and an image processing unit. The inspection device is designed to scan a wafer and generate an inspected image. The image processing unit analyzes this image using deep learning algorithms to identify any defects in a specified region of interest. If defects are detected, the inspection device magnifies the area for better identification.

Career Highlights

Yu-Ting Wang is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work has contributed to advancements in wafer inspection technology, enhancing the efficiency and accuracy of semiconductor manufacturing processes.

Collaborations

Yu-Ting Wang collaborates with talented colleagues, including Chung-Pin Chou and Jui-Kuo Lai. Their combined expertise fosters innovation and drives progress in their projects.

Conclusion

Yu-Ting Wang's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the industry. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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