This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Innovations of Yu-Ping Lan in Thickness Measurement Technology.
Introduction
Yu-Ping Lan is an accomplished inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of thickness measurement technology. His innovative approach has led to the development of a unique system that enhances measurement accuracy.
Latest Patents
Yu-Ping Lan holds a patent for a "System and method for thickness measurement." This invention involves a sophisticated setup that includes two confocal microscopes. The system emits light beams in opposing directions and focuses them at specific focal planes. By adjusting the relative positions of the microscopes, the system achieves precise thickness measurements.
Career Highlights
Yu-Ping Lan is affiliated with the Industrial Technology Research Institute, where he continues to advance research and development in measurement technologies. His work has garnered attention for its practical applications in various industries.
Collaborations
Some of his notable coworkers include Kai-Yu Cheng and Yen-Liang Chen, who contribute to the collaborative efforts in research and innovation.
Conclusion
Yu-Ping Lan's contributions to thickness measurement technology exemplify the impact of innovative thinking in scientific research. His patent reflects a commitment to enhancing measurement techniques, which can benefit multiple sectors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile