Hsinchu, Taiwan

Yu-Jen Su

This inventor holds 1 USPTO granted patent. Top assignee: Gudeng Equipment Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu-Jen Su. Retrieved from https://idiyas.com/inventor/yu-jen-su-oywmegjq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yu-Jen Su and Optical Inspection Innovation.

Introduction

Yu-Jen Su is an inventor based in Hsinchu, Taiwan. His patent work includes an optical inspection system designed to distinguish circuit defects from patterns caused by surface metallic texture. Su is associated with Gudeng Equipment Co., Ltd.

Latest Patents

Su is named on one patent, titled “Optical Inspection System of Eliminating Image Noise.” The system uses polarized light to illuminate circuits and capture the reflected light through a second polarizer. An operation processor analyzes the resulting image to determine whether the circuits have defects apart from surface metallic texture. This approach aims to reduce image noise associated with the circuits’ metallic surface patterns and support more reliable inspection.

Career Highlights

Su’s documented patent contribution focuses on optical inspection and image analysis for circuit evaluation. His work addresses a practical challenge in detecting defects when surface texture can create misleading patterns in inspection images.

Collaborations

Su is associated with Gudeng Equipment Co., Ltd. His listed coworkers include Che-Wei Chan and Lin-Hsin Tu.

Conclusion

Yu-Jen Su’s patent describes a polarized-light inspection method that helps separate circuit defects from surface-texture patterns, reflecting his contribution to optical inspection technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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