The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Mar. 21, 2024
Gudeng Equipment Co., Ltd., New Taipei City, TW;
Gudeng Equipment Co., LTD., New Taipei City, TW;
Abstract
An optical inspection system of removing a pattern relevant to surface metallic texture on circuits from an image to be inspected includes a first light source module, an image forming module and an operation processor. The first light source module includes a first polarizer and a linear light source. The first polarizer has a first polarization axis. The linear light source emits a linear light beam which passes through the first polarizer to project polarization beam onto the circuits. The image forming module includes a second polarizer and an optical detector. The optical detector receives a reflection beam generated by the linear polarization beam being reflected from the circuits and passing through the second polarizer. The operation processor receives the image to be inspected generated by the reflection beam, and analyzes the image to be inspected for determining whether the circuits have any defect except the surface metallic texture.