Che-Wei Chan

Title: Che-Wei Chan and Optical Inspection Innovation.

Introduction

Che-Wei Chan is an inventor associated with Tainan City, Taiwan, and Gudeng Equipment Co., Ltd. His patent work addresses optical inspection of circuits, with a focus on distinguishing defects from surface patterns caused by metallic texture.

Latest Patents

Chan is associated with 1 patent, titled “Optical Inspection System of Eliminating Image Noise.” The system uses polarized light to inspect circuits. A linear light source sends light through a first polarizer and onto the circuit surface. Reflected light then passes through a second polarizer to an optical detector, which produces an image for an operation processor to analyze. The processor evaluates the image for circuit defects while filtering out patterns related to surface metallic texture.

Career Highlights

Chan’s patent describes an approach to reducing image noise in circuit inspection. By accounting for surface texture, the system is designed to help distinguish relevant defects from visual patterns that could otherwise interfere with inspection.

Collaborations

Chan is associated with Gudeng Equipment Co., Ltd. His listed coworkers include Lin-Hsin Tu and Yu-Jen Su.

Conclusion

Che-Wei Chan’s patent focuses on improving circuit inspection by using polarized illumination and image analysis to separate potential defects from surface metallic texture.