Yu-Hao Chen is a prominent inventor based in Chu-Pei, Taiwan. He has made significant contributions to the field of semiconductor testing, holding a total of 5 patents. His work focuses on developing advanced probe card technologies that enhance the efficiency and accuracy of semiconductor testing.

Latest Patents

Yu-Hao Chen's latest patents include a range of innovative technologies. These patents cover a probe card, a method for designing the probe card, a method for producing a tested semiconductor device, a method for testing unpackaged semiconductors by probe card, and a device under test and probe system. The probe card features a wiring substrate, a connection carrier board, and a probe device. Notably, at least two probes form a differential pair that is electrically connected to a loopback line of the connection carrier board, creating a test signal loopback path. The probe device is designed with specific impedance characteristics to ensure optimal performance during testing.

Career Highlights

Yu-Hao Chen is currently employed at Mpi Corporation, where he continues to innovate in the semiconductor testing industry. His work has been instrumental in advancing the technology used in probe cards, which are essential for testing semiconductor devices. His expertise and innovative approach have positioned him as a key figure in his field.

Collaborations

Yu-Hao Chen collaborates with several talented individuals, including Hao Wei and Chin-Tien Yang. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies in semiconductor testing.

Conclusion

In summary, Yu-Hao Chen is a distinguished inventor whose contributions to semiconductor testing have led to significant advancements in the industry. His innovative patents and collaborative efforts continue to shape the future of semiconductor technology.

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