The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Oct. 11, 2018
Applicant:

Mpi Corporation, Chu-Pei, TW;

Inventors:

Hao Wei, Chu-Pei, TW;

Chia-Nan Chou, Chu-Pei, TW;

Chien-Chiao Chen, Chu-Pei, TW;

Chia-An Yu, Chu-Pei, TW;

Yu-Hao Chen, Chu-Pei, TW;

Assignee:

MPI CORPORATION, Chu-Pei, Hsinchu Shien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); H05K 1/18 (2006.01); H05K 1/11 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07385 (2013.01); G01R 1/0675 (2013.01); G01R 1/06772 (2013.01); G01R 1/07307 (2013.01); G01R 1/07342 (2013.01); G01R 1/07371 (2013.01); G01R 31/2889 (2013.01); H05K 1/111 (2013.01); H05K 1/181 (2013.01);
Abstract

A probe card includes a printed circuit board (PCB), a connection substrate electrically connected with the PCB, a probe head, and a signal path switching module disposed on a lateral periphery surface or a bottom surface of the connection substrate, electrically connected with probe needles of the probe head and the connection substrate and including first and second circuit lines with first and second inductors respectively, and a capacitor electrically connected between the first and second circuit lines. A test signal from a tester is transmitted between the tester and a device under test (DUT) via the PCB, the connection substrate, the first and second circuit lines and the probe needles. A loopback test signal from the DUT is transmitted back to the DUT via the probe needles, parts of the first and second circuit lines and the capacitor.


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