Hsinchu, Taiwan

Yu-Fong Tai

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu-Fong Tai. Retrieved from https://idiyas.com/inventor/yu-fong-tai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Innovations by Yu-Fong Tai

Introduction

Yu-Fong Tai is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of fabrication facility management through his innovative patent. His work focuses on enhancing operational efficiencies within fabrication facilities.

Latest Patents

Yu-Fong Tai holds a patent for a "Service code system and method for scheduling fabrication facility utilization." This patent addresses the management of work-in-process (WIP) workloads within fabrication facilities. The system determines a series of routing sub-sequences from an overall routing sequence for fabricating the WIP workload. By utilizing service codes for routing, operational efficiencies can be realized during the fabrication process. He has 1 patent to his name.

Career Highlights

Tai is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His role involves leveraging his expertise to improve the efficiency of fabrication processes.

Collaborations

Some of his coworkers include Chun-Yi Tsai and Chao-Hsin Chang, who contribute to the collaborative environment at Taiwan Semiconductor Manufacturing Company Limited.

Conclusion

Yu-Fong Tai's innovative approach to managing fabrication facility workloads exemplifies the impact of effective patenting in the semiconductor industry. His contributions continue to influence operational efficiencies in fabrication processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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