Company Filing History:
Years Active: 2004
Title: Yu-Fen Tsai: Innovator in Scan Line Misalignment Detection
Introduction
Yu-Fen Tsai is a notable inventor based in Tai-Chung, Taiwan. She has made significant contributions to the field of imaging technology, particularly in the detection of scan line misalignments. Her innovative approach has the potential to enhance the accuracy of scanning devices.
Latest Patents
Yu-Fen Tsai holds a patent for a method designed to determine scan line misalignments. The patent describes a test image featuring a black bias on a white background. This black bias is strategically set at approximately 45 degrees to the scan lines of a scanner. The method involves identifying boundary points of the scanned bias and calculating a regression line based on these points. By analyzing the differences in the positions of adjacent boundary points, along with the slope reciprocal of the regression line, error values can be determined. These error values are then compared with a gate value to identify any occurrences of scan line misalignment.
Career Highlights
Yu-Fen Tsai is currently employed at Mustek Systems Inc., where she continues to develop innovative solutions in imaging technology. Her work has been instrumental in improving the performance and reliability of scanning devices.
Collaborations
Yu-Fen collaborates with her coworker, Te-Chih Chang, who brings valuable insights and expertise to their projects.
Conclusion
Yu-Fen Tsai's contributions to the field of imaging technology, particularly through her patent on scan line misalignment detection, highlight her innovative spirit and dedication to enhancing scanning accuracy. Her work at Mustek Systems Inc. continues to pave the way for advancements in this critical area.