The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2004
Filed:
Dec. 21, 2000
Applicant:
Inventors:
Yu-Fen Tsai, Tai-Chung, TW;
Te-Chih Chang, Hsin-Chu, TW;
Assignee:
Mustek Systems Inc., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract
A test image has a black bias on a white background. The black bias is a line set at about 45 degrees to the scan lines of a scanner. Boundary points of the scanned bias are found. A regression line is calculated from the positions of the boundary points. Differences in the positions of adjacent boundary points, together with the slope reciprocal of the regression line, are used to determine error values. The error values are compared with a gate value to determine if there are any occurrences of scan line misalignment.