San Jose, CA, United States of America

Yowjuang (Bill) Liu


Average Co-Inventor Count = 2.3

ph-index = 7

Forward Citations = 143(Granted Patents)


Company Filing History:


Years Active: 2004-2012

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12 patents (USPTO):

Title: Yowjuang (Bill) Liu: Innovator in Integrated Circuit Technology

Introduction

Yowjuang (Bill) Liu is a prominent inventor based in San Jose, CA, known for his significant contributions to the field of integrated circuit technology. With a total of 12 patents to his name, Liu has made remarkable advancements that enhance the performance and reliability of electronic devices.

Latest Patents

Among his latest innovations are two notable patents. The first is an "ESD protection device for high performance IC," which includes a circuit structure designed for electrostatic discharge (ESD) protection. This invention allows for the protection of devices within an integrated circuit without requiring additional processing steps beyond those used for fabricating the ESD-protected devices. The second patent, "Density transition zones for integrated circuits," introduces an integrated circuit featuring a spiral inductor surrounded by a transition zone. This transition zone is characterized by an octagonal geometry, which optimizes the arrangement of metal layers and enhances uniform densities in specific geometries.

Career Highlights

Liu is currently employed at Altera Corporation, where he continues to push the boundaries of innovation in integrated circuits. His work has not only contributed to the advancement of technology but has also positioned him as a key figure in the industry.

Collaborations

Throughout his career, Liu has collaborated with esteemed colleagues, including Cheng H Huang and Peter John McElheny. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Yowjuang (Bill) Liu's contributions to integrated circuit technology exemplify the spirit of innovation. His patents reflect a commitment to enhancing electronic device performance and reliability, making him a significant figure in the field.

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