San Francisco, CA, United States of America

Youzhi Zou

This inventor holds 1 USPTO granted patent. Top assignee: Apcera, Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Youzhi Zou. Retrieved from https://idiyas.com/inventor/youzhi-zou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 90(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Innovations by Youzhi Zou

Introduction

Youzhi Zou is an accomplished inventor based in San Francisco, CA. He has made significant contributions to the field of technology, particularly in the area of platform anomaly detection. His innovative approach utilizes neural networks to enhance the reliability of computing platforms.

Latest Patents

Youzhi Zou holds a patent for a "System and method for detecting platform anomalies through neural networks." This patent describes a sophisticated system that involves obtaining platform data and performing data motif detection on various timescales. The method synthesizes platform data anomaly detection with features from data motif detection, signaling any detected anomalies through a neural network model. This invention showcases his expertise in leveraging advanced technologies to improve system performance.

Career Highlights

Youzhi Zou is currently employed at Apcera, Inc., where he continues to develop innovative solutions in the tech industry. His work focuses on enhancing the security and efficiency of computing platforms, making significant strides in the field.

Collaborations

One of his notable coworkers is Derek Collison, with whom he collaborates on various projects aimed at advancing technology in their field.

Conclusion

Youzhi Zou's contributions to technology through his patent and work at Apcera, Inc. highlight his role as a leading inventor in the industry. His innovative methods for detecting platform anomalies demonstrate the potential for improving computing systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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