The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Mar. 13, 2014
Applicant:

Apcera, Inc., San Francisco, CA (US);

Inventors:

Youzhi Zou, San Francisco, CA (US);

Derek Collison, San Francisco, CA (US);

Assignee:

APCERA, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/049 (2013.01);
Abstract

A system and method for detecting behavior of a computing platform that includes obtaining platform data; for each data motif identifiers in a set data motif identifiers, performing data motif detection on data in an associated timescale, wherein a first data motif identifier operates on data in a first timescale, wherein a second data motif identifier operates on data in a second timescale, wherein the first timescale and second timescale are different; in a neural network model, synthesizing platform data anomaly detection with at least a set of features inputs from data motif detection of the set of motif identifiers; and signaling if a platform data anomaly is detected through the neural network model.


Find Patent Forward Citations

Loading…