Company Filing History:
Years Active: 2020-2025
Title: Young Uk Yim: Innovator in Electrostatic Discharge Protection
Introduction
Young Uk Yim is a notable inventor based in San Diego, CA. He has made significant contributions to the field of integrated circuit design, particularly in electrostatic discharge (ESD) protection circuits. With a total of 4 patents to his name, Yim continues to push the boundaries of innovation in his field.
Latest Patents
One of Yim's latest patents is an electrostatic discharge circuit for a multi-voltage rail thin-gate output driver. This ESD protection circuit features a first diode coupled between a first power source of an integrated circuit device and an input/output pad. Additionally, a second diode is coupled between a second power source of the integrated circuit device and the input/output pad. A resistive element connects the second diode to the first diode and to the input/output pad. The first power source supplies a driver circuit connected to the input/output pad, while the second power source powers one or more core circuits of the integrated circuit device. The resistive element is designed to create a voltage differential during an electrostatic discharge event, enhancing the circuit's protection capabilities.
Career Highlights
Young Uk Yim is currently employed at Qualcomm Incorporated, a leading company in the telecommunications and semiconductor industry. His work focuses on developing advanced technologies that improve the reliability and performance of electronic devices.
Collaborations
Yim has collaborated with several talented individuals in his field, including Satish Krishnamoorthy and Ashwin Sethuram. These collaborations have contributed to the successful development of innovative solutions in integrated circuit design.
Conclusion
Young Uk Yim is a prominent inventor whose work in electrostatic discharge protection circuits has made a significant impact in the field of integrated circuit design. His contributions continue to advance technology and improve the reliability of electronic devices.