Ichon, South Korea

Young Park Kim

This inventor holds 1 USPTO granted patent. Top assignee: Hynix Semiconductor Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Young Park Kim. Retrieved from https://idiyas.com/inventor/young-park-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Young Park Kim: Innovator in Semiconductor Technology

Introduction

Young Park Kim is a notable inventor based in Ichon-si, South Korea. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent.

Latest Patents

Young Park Kim holds a patent for a semiconductor apparatus and calibration method. This invention includes a reference voltage generation unit, a comparison voltage generation unit, and a calibration unit. The reference voltage generation unit is located in a reference die and is designed to generate a reference voltage. The comparison voltage generation unit is situated in a die stacked on the reference die and is responsible for generating a comparison voltage in response to a calibration control signal. The calibration unit compares the levels of the reference and comparison voltages and generates the calibration control signal.

Career Highlights

Young Park Kim is currently employed at Hynix Semiconductor Inc., a leading company in the semiconductor industry. His work focuses on advancing semiconductor technologies and improving calibration methods.

Collaborations

Some of his coworkers include Yong Kee Kwon and Hyung Dong Lee, who contribute to the innovative environment at Hynix Semiconductor Inc.

Conclusion

Young Park Kim's contributions to semiconductor technology through his patent demonstrate his expertise and commitment to innovation in the field. His work continues to influence advancements in semiconductor apparatus and calibration methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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