The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8154019 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 10, 2012

Filed:

Dec. 29, 2009
Applicants:

Yong Kee Kwon, Ichon-si, KR;

Hyung Dong Lee, Ichon-si, KR;

Young Park Kim, Ichon-si, KR;

Inventors:

Yong Kee Kwon, Ichon-si, KR;

Hyung Dong Lee, Ichon-si, KR;

Young Park Kim, Ichon-si, KR;

Assignee:

Hynix Semiconductor Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor apparatus includes a reference voltage generation unit, a comparison voltage generation unit, and a calibration unit. The reference voltage generation unit is disposed in a reference die and configured to generate a reference voltage. The comparison voltage generation unit is disposed in a die stacked on the reference die and configured to generate a comparison voltage in response to a calibration control signal. The calibration unit is configured to compare a level of the reference voltage with a level of the comparison voltage and generate the calibration control signal.


Find Patent Forward Citations

Kwon, Yong. (2012). Semiconductor apparatus and calibration method thereof (U.S. Patent No. 8154019). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8154019

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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