Busan, South Korea

Young Min Seong

This inventor holds 1 USPTO granted patent. Top assignee: Korea Research Institute of Standards and Science. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Young Min Seong. Retrieved from https://idiyas.com/inventor/young-min-seong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Young Min Seong: Innovator in Nonlinear Parameter Measurement

Introduction

Young Min Seong is a notable inventor based in Busan, South Korea. He has made significant contributions to the field of measurement technology, particularly in the area of nonlinear parameters. His work is essential for advancing the accuracy and efficiency of various measurement applications.

Latest Patents

Young Min Seong holds a patent for an "Apparatus and method for measuring nonlinear parameters." This invention relates to a technology designed to measure nonlinear parameters of an object, enhancing the precision of measurements in various scientific and industrial applications. He has 1 patent to his name, showcasing his innovative approach to solving complex measurement challenges.

Career Highlights

Seong is affiliated with the Korea Research Institute of Standards and Science, where he applies his expertise in measurement technology. His role at this prestigious institution allows him to contribute to the development of standards and methodologies that benefit various industries.

Collaborations

Throughout his career, Young Min Seong has collaborated with esteemed colleagues, including Dae Cheol Seo and Seung Hyun Cho. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Young Min Seong's contributions to the field of nonlinear parameter measurement highlight his role as an influential inventor. His work not only advances measurement technology but also sets a foundation for future innovations in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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