The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Nov. 04, 2013
Applicant:
Korea Research Institute of Standards and Science, Daejeon, KR;
Inventors:
Dae Cheol Seo, Daejeon, KR;
Seung Hyun Cho, Sejong, KR;
Choon Su Park, Daejeon, KR;
Seung Seok Lee, Daejeon, KR;
Young Min Seong, Busan, KR;
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/14 (2006.01); G01N 29/24 (2006.01); G01N 29/34 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2418 (2013.01); G01N 29/14 (2013.01); G01N 29/343 (2013.01); G01N 2291/0258 (2013.01); G01N 2291/02491 (2013.01); G01N 2291/101 (2013.01); G01N 2291/102 (2013.01);
Abstract
The present invention relates to a technology for measuring a nonlinear parameter of an object to be measured, and more particularly, to an apparatus and method for measuring a nonlinear parameter of an object to be measured.