Jhubei, Taiwan

Young-Cheng Chen

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Young-Cheng Chen. Retrieved from https://idiyas.com/inventor/young-cheng-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Young-Cheng Chen and Semiconductor Process Control.

Introduction

Young-Cheng Chen is an inventor based in Jhubei, Taiwan. His patent work addresses process control in semiconductor manufacturing, with a focus on achieving precise critical dimensions in production.

Latest Patents

Chen is associated with 1 patent, titled “Process Controller for Semiconductor Manufacturing.” The patent describes a method for controlling a product’s critical dimensions during a semiconductor processing operation. It measures a previously formed dimension, calculates an energy value using the measured and desired dimensions, and determines the target energy by considering the energy used for a prior product. This approach is intended for production flows involving low-volume, high-precision semiconductor products.

Career Highlights

Chen’s disclosed invention concerns the relationship between process energy and dimensional accuracy. By using measurements from the product and information from an earlier production step, the method provides a way to adjust processing conditions toward a desired critical dimension.

Collaborations

Chen is associated with Taiwan Semiconductor Manufacturing Company, Ltd. His coworker, You-Wei Shen, is also identified in connection with the provided information.

Conclusion

Young-Cheng Chen’s patent highlights a process-control approach for improving dimensional precision in semiconductor manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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