Cheongju, South Korea

Young-bae Choi

This inventor holds 1 USPTO granted patent. Top assignee: Haechitech Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Young-bae Choi. Retrieved from https://idiyas.com/inventor/young-bae-choi-l6sk7l9k

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Young-bae Choi: Innovator in Magnetic Sensor Technology

Introduction

Young-bae Choi is a prominent inventor based in Cheongju, South Korea. He has made significant contributions to the field of magnetic sensor technology. His innovative work has led to the development of a unique patent that enhances the testing of magnetic sensors.

Latest Patents

Young-bae Choi holds a patent for a "Magnetic sensor test apparatus and method of testing a magnetic sensor." This invention provides a magnetic sensor test apparatus that includes a vertical coil and at least one periphery coil disposed peripherally about the vertical coil. Both coils are designed to generate a horizontal and/or vertical magnetic field in a semiconductor wafer. This advancement is crucial for improving the accuracy and efficiency of magnetic sensor testing.

Career Highlights

Choi is currently associated with Haechitech Corporation, where he continues to innovate and develop new technologies. His work at the company has positioned him as a key player in the field of magnetic sensors.

Collaborations

He collaborates with talented coworkers, including Kyung-seok Jin and Young-sug Seong, who contribute to the innovative environment at Haechitech Corporation.

Conclusion

Young-bae Choi's contributions to magnetic sensor technology exemplify his dedication to innovation and excellence in his field. His patent and ongoing work continue to influence advancements in sensor testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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